smartctl 6.0 2012-10-10 r3643 [i686-linux-3.5.6-pmagic] (local build) Copyright (C) 2002-12, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: ST320LM000 HM321HI Serial Number: S24PJ9AC540879 LU WWN Device Id: 5 0004cf 2078fbf36 Firmware Version: 2AJ10001 User Capacity: 320,072,933,376 bytes [320 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 5400 rpm Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Tue Jan 1 00:35:21 2013 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 121) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: ( 4740) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 79) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 59 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 3 Spin_Up_Time 0x0023 089 087 025 Pre-fail Always - 3418 4 Start_Stop_Count 0x0032 098 098 000 Old_age Always - 2736 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 1366 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 089 089 000 Old_age Always - 11682 12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 2818 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 6166 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 055 051 000 Old_age Always - 45 (Min/Max 21/49) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 1 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 38 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 5509 223 Load_Retry_Count 0x0032 089 089 000 Old_age Always - 11682 225 Load_Cycle_Count 0x0032 091 091 000 Old_age Always - 91994 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 1116 hours (46 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 01 05 08 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000805 = 2053 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 05 08 00 e0 00 00:00:00.005 READ DMA c8 00 01 04 08 00 e0 00 00:00:00.005 READ DMA c8 00 01 03 08 00 e0 00 00:00:00.005 READ DMA c8 00 01 02 08 00 e0 00 00:00:00.005 READ DMA c8 00 01 01 08 00 e0 00 00:00:00.005 READ DMA Error 1 occurred at disk power-on lifetime: 1116 hours (46 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 02 66 09 00 e0 Error: ICRC, ABRT 2 sectors at LBA = 0x00000966 = 2406 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 67 09 00 e0 00 00:00:00.005 READ DMA c8 00 01 66 09 00 e0 00 00:00:00.005 READ DMA c8 00 01 65 09 00 e0 00 00:00:00.005 READ DMA c8 00 01 64 09 00 e0 00 00:00:00.005 READ DMA c8 00 01 63 09 00 e0 00 00:00:00.005 READ DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed: read failure 90% 1366 55275778 SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed_read_failure [90% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.